Chris Allsup
Co-founder, Aurametrix

Chris Allsup has extensive experience in sales and marketing of electronic design automation and test products, cloud-based design solutions and VoIP systems. He has worked with cutting-edge technologies ranging from high-level digital synthesis to analog physical synthesis and automatic test pattern generation. Chris earned a BSEE degree from UC San Diego and an MBA degree from Santa Clara University, and has authored numerous articles and papers about design, test and economics.

Selected Blog Posts

Lessons from 2001: A Space Odyssey, June 25, 2023

Webinars

​STMicroelectronics and Synopsys Present: How iCube Technology in TetraMAX II is Breaking the ATPG Sound Barrier, October 27, 2016

STMicroelectronics’ Experience: Synopsys Logic BIST for Automotive and Safety-Critical Designs, July 30, 2015

Advantest and Synopsys: Taking Test Cost Reduction to the Next Level, April 30, 2015

Interviews

Experts Roundtable: Design-For-Test, Systems Design Engineering

Synopsys addresses yield, memory test, and small delay defects, Test & Measurement World

Synopsys develops new ATPG technology, EE Times

White papers

The Path to (Virtually) Zero Defective Parts Per Million

ISO 26262-Certified Solution for Testing of Safety-Critical Automotive ICs

DFTMAX Compression shared I/O

More effective Test: Slack-Based Transition Delay
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Test Automation of 3D Integrated Systems
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Selected Articles

Allsup C.K., Gabashvili I.S., Democratizing Strategic Planning in Master-Planned Communities, arXiv:2410.04676 (econ.EM), October 7, 2024


Allsup C.K., Gabashvili .S., Modeling the Dynamics of Growth in Master-Planned Communities, arXiv:2408.14214v2 (econ.EM), August 26, 2024


Allsup C.,  An ISO 26262 approach to meeting the cost, quality, reliability, and integration needs of automotive ICs , Tech Design Forum, January 16, 2017

Allsup C., Faster and Fewer Patterns with Breakthrough ATPG to the Rescue  EE Times, August 10, 2016

Allsup C., Armstrong D., Cron A., Reducing IC test costs through multisite and concurrent testing, Test Design Forum, November 6, 2015

Allsup C., Test trends: Commercial scan compression tools, The EDN Network, Test-and-measurement Design Center, July 17, 2013

Allsup C., Chung K., DFT strategy for ARM processor-based designs, EDN Network, January 22, 2013

Allsup C., 20nm test demands new design-for-test and diagnostic strategies  Tech Design Forum, November 5, 2012

Allsup C., Frank S., Use Advances in Synthesis Technology to Cut Implementation Time, Chip Design Magazine, February 21, 2012

Allsup C., Chen C-A, Chen Y-W, Cron A., The fast track to 3D-IC testing, EE Times, January 16, 2012

Allsup C., Enabling early RTL exploration, Electronics Magazine, December 18, 2011

Allsup C., Is built-in logic redundancy ready for prime time?, 11th International Symposium on Quality Electronic Design (ISQED), March 22, 2010

Allsup C., Dodd C., Using compression to meet pin-limited test requirements, EE Times, January 21, 2010

Allsup C., Kapur R., Predictive solutions for test-The next DFT paradigm?, IEEE International Test Conference, November 2009

Allsup C., Appello D., Mattiuzzo R., Small Delay Defect Testing, Test & Measurement World, June 1, 2009 (download pdf)

Allsup C., The Economics of Defect-Based Testing, IEEE International Workshop on Defect & Data-Driven Testing, October 30, 2008 ( download pdf)

Allsup C., Lloyd B.,  Playing it cool, EDN Network, October 1, 2008

Allsup C., Early relief for 45-nm routing congestion, EE Times, April 7, 2008

Allsup C., Design for Low-Power Manufacturing Test, EE Times, March, 18, 2008

Allsup C., Perform Low Power Manufacturing Test, EE Times Asia (download pdf: part 1: January 16, 2008, part 2: February 1, 2008)

Allsup C., The Benefits -- And Hazards -- Of Scan Compression, Electronic Design, August 2, 2007

Allsup C., Measuring Scan Compression Performance, EDA Design Line, May 27, 2007 (download pdf)

Allsup C., Optimizing compression in scan-based ATPG DFT implementations,  The EDN Network, Test-and-measurement Design Center, March 1, 2007

Allsup C., How Design Automation Is Reshaping the Foundry-Client Dynamic, Test and Measurement World, February 2007 ( download pdf)  

Allsup C.,  The Economics of Implementing Scan Compression to Reduce Test Data Volume and Test Application Time, IEEE International Test Conference, October 2006

Allsup C., Kapur R., DFT rule checkers glue design together, EE Times Asia, October 16, 2006 ( download pdf)

Allsup C., Limits of test time reduction, EDN Network, June 1, 2006

Allsup C., How much test compression is enough? EE Times, Test and Measurement, February 20, 2006